Kookmin University's Joint Instrumentation Center to hold 'Advanced Instrumentation Analysis Seminar' on the 23rd and 24th
Inviting four current experts in advanced equipment analysis
- 24.12.30 / 이정민
The Kookmin University Industry-Academic Cooperation Foundation announced on the 12th that it will hold a 'Seminar on Advanced Instrumental Analysis' at Room 513 of the Mirae Hall and Room 17 on the first basement floor of the Engineering Hall from the 23rd to the 24th.
The 'Advanced Instrument Analysis Seminar', which is jointly hosted by the Kookmin University Joint Instrumentation Center and the LINC 3.0 Project Team and sponsored by the Ministry of Trade, Industry and Energy's Semiconductor Major Track Project Team, was organized to promote the joint use of advanced research equipment by providing theoretical education tailored to the characteristics of each piece of equipment and field to university (graduate) students, undergraduate students, and employees of industry-academia cooperation partner companies.
In this seminar, training on X-ray photoelectron spectroscopy (XPS), transmission electron microscopy (TEM), scanning electron microscopy (SEM), and X-ray diffraction analyzer (XRD) will be conducted under the theme of surface and structural analysis equipment. On the 23rd, Dr. Ryu Il-hwan of Kookmin University will give a lecture on “XPS: Fundamentals and Applications of Photoelectron Spectroscopy,” and Dr. Park Yun-chang, Director of the Center for Nanotechnology, will give a lecture on “TEM: Theory of Transmission Electron Microscopy and Sample Preparation.”
On the 24th, Joo-Young Kang, a manager at Gyeonggonggyo, will give a lecture on “SEM: Theory and Application of Scanning Electron Microscopy,” and Jong-Sik Lee, an advisor at ITS Korea, will give a lecture on “XRD: Analysis of the Crystal Structure of Materials Using X-rays,” providing the expertise and know-how needed in industrial sites and laboratories using research equipment.
“Our university has been at the forefront of fostering convergence talent and advancing industry-academia-research cooperation by expanding infrastructure in specialized fields,” said Kim Dae-jeong, director of the National University's Joint Instrumentation Center (professor, Department of Electrical Engineering). ”We will further expand our education programs by field and level to promote the joint use of advanced research equipment owned by the university.”
Anyone interested in using the research equipment can apply for the advanced equipment analysis seminar through the Kookmin University Joint Instrumentation Center website, and the training is free of charge. Those who complete the course will be awarded a certificate of completion from the Director of the Kookmin University Joint Instrument Center.
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This content is translated from Korean to English using the AI translation service DeepL and may contain translation errors such as jargon/pronouns. If you find any, please send your feedback to kookminpr@kookmin.ac.kr so we can correct them.
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Kookmin University's Joint Instrumentation Center to hold 'Advanced Instrumentation Analysis Seminar' on the 23rd and 24th Inviting four current experts in advanced equipment analysis |
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2024-12-30
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The Kookmin University Industry-Academic Cooperation Foundation announced on the 12th that it will hold a 'Seminar on Advanced Instrumental Analysis' at Room 513 of the Mirae Hall and Room 17 on the first basement floor of the Engineering Hall from the 23rd to the 24th.
The 'Advanced Instrument Analysis Seminar', which is jointly hosted by the Kookmin University Joint Instrumentation Center and the LINC 3.0 Project Team and sponsored by the Ministry of Trade, Industry and Energy's Semiconductor Major Track Project Team, was organized to promote the joint use of advanced research equipment by providing theoretical education tailored to the characteristics of each piece of equipment and field to university (graduate) students, undergraduate students, and employees of industry-academia cooperation partner companies.
In this seminar, training on X-ray photoelectron spectroscopy (XPS), transmission electron microscopy (TEM), scanning electron microscopy (SEM), and X-ray diffraction analyzer (XRD) will be conducted under the theme of surface and structural analysis equipment. On the 23rd, Dr. Ryu Il-hwan of Kookmin University will give a lecture on “XPS: Fundamentals and Applications of Photoelectron Spectroscopy,” and Dr. Park Yun-chang, Director of the Center for Nanotechnology, will give a lecture on “TEM: Theory of Transmission Electron Microscopy and Sample Preparation.”
On the 24th, Joo-Young Kang, a manager at Gyeonggonggyo, will give a lecture on “SEM: Theory and Application of Scanning Electron Microscopy,” and Jong-Sik Lee, an advisor at ITS Korea, will give a lecture on “XRD: Analysis of the Crystal Structure of Materials Using X-rays,” providing the expertise and know-how needed in industrial sites and laboratories using research equipment.
“Our university has been at the forefront of fostering convergence talent and advancing industry-academia-research cooperation by expanding infrastructure in specialized fields,” said Kim Dae-jeong, director of the National University's Joint Instrumentation Center (professor, Department of Electrical Engineering). ”We will further expand our education programs by field and level to promote the joint use of advanced research equipment owned by the university.”
Anyone interested in using the research equipment can apply for the advanced equipment analysis seminar through the Kookmin University Joint Instrumentation Center website, and the training is free of charge. Those who complete the course will be awarded a certificate of completion from the Director of the Kookmin University Joint Instrument Center.
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