Received the Best Poster Award at the Korean Conference on Semiconductors (KCS) / Sunghyun Jung (Master's Program in Intelligent Semiconductors and Displays, Graduate School of Engineering, 25)
- 25.03.31 / 이정민
National University of Korea Intelligent Semiconductor Devices and Integrated Circuits Laboratory (S!LK) (Supervising Professors: Sungjin Choi, Yoonjung Lee, Daehwan Kim) Jung Sung-hyun, a student in the master's program in the Department of Intelligent Semiconductors and Displays at the Graduate School, won the Best Poster Award at the 32nd Korea Conference on Semiconductor (KCS) 2025 for his poster titled “Gate-Voltage Difference Method for Separate Extraction of Parasitic Source and Drain Resistances in Individual MOSFETs under Linear Operation.”
This study proposed a new method for more accurate and efficient measurement of parasitic resistance, which is one of the main causes of performance degradation in semiconductor devices. In particular, the method of separating and precisely analyzing the resistance values of the source and drain of MOSFETs, which are the core of semiconductor devices, was highly evaluated.
The existing method has the disadvantages of being complicated and time-consuming, and requiring a large number of semiconductor devices, but this study presents a method that can easily and precisely extract the resistance value using only the difference in the gate voltage in a single semiconductor device. This is expected to make it possible to perform performance evaluation of semiconductor devices and quality control in the manufacturing process more efficiently.
This award is a testament to the outstanding research capabilities of our university and the Intelligent Semiconductor Devices and Integrated Circuits Laboratory (S!LK), and we expect it to continue to contribute to the development of semiconductor technology in the future.
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Received the Best Poster Award at the Korean Conference on Semiconductors (KCS) / Sunghyun Jung (Master's Program in Intelligent Semiconductors and Displays, Graduate School of Engineering, 25) |
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2025-03-31
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National University of Korea Intelligent Semiconductor Devices and Integrated Circuits Laboratory (S!LK) (Supervising Professors: Sungjin Choi, Yoonjung Lee, Daehwan Kim) Jung Sung-hyun, a student in the master's program in the Department of Intelligent Semiconductors and Displays at the Graduate School, won the Best Poster Award at the 32nd Korea Conference on Semiconductor (KCS) 2025 for his poster titled “Gate-Voltage Difference Method for Separate Extraction of Parasitic Source and Drain Resistances in Individual MOSFETs under Linear Operation.”
This study proposed a new method for more accurate and efficient measurement of parasitic resistance, which is one of the main causes of performance degradation in semiconductor devices. In particular, the method of separating and precisely analyzing the resistance values of the source and drain of MOSFETs, which are the core of semiconductor devices, was highly evaluated.
The existing method has the disadvantages of being complicated and time-consuming, and requiring a large number of semiconductor devices, but this study presents a method that can easily and precisely extract the resistance value using only the difference in the gate voltage in a single semiconductor device. This is expected to make it possible to perform performance evaluation of semiconductor devices and quality control in the manufacturing process more efficiently.
This award is a testament to the outstanding research capabilities of our university and the Intelligent Semiconductor Devices and Integrated Circuits Laboratory (S!LK), and we expect it to continue to contribute to the development of semiconductor technology in the future.
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