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Best Paper Award at the Korean Conference on Semiconductors (KCS) / Ha-Young Bang (M.S. student, Department of Intelligent Semiconductor and Display, Graduate School of General Studies, 23)

  • 24.03.25 / 박서연
Date 2024-03-25 Hit 399

 

 

 

 

 

 

 

 

 

 

 

Ha-Young Bang, a master's student in the Department of Intelligent Semiconductors and Displays, Graduate School of General Studies, won the best paper award at the 30th Korea Conference on Semiconductors (KCS). 

 

 


The winning paper was titled 'Investigation of dynamic negative bias temperature instability of 1x-nm DRAM peripheral PMOS transistors for cryogenic memory applications'.
As the amount of data continues to increase, there is a growing demand for high-performance and low-power computing technologies to overcome the limitations of computing large amounts of data. As a result, quantum computers need to be built as the next generation technology, but quantum computers are highly sensitive to noise and require stable operation in cryogenic environments. 
On the other hand, DRAM is one of the most stable memories in cryogenic environments, and the device gradually degrades as negative stress is applied to the pMOSFETs during CMOS inverter operation. 
 

 

 

 

 

 

 

 

This study analyzed the reliability under operating conditions at all temperatures, including cryogenic temperatures, and proposed the cause of degradation according to the gate oxide thickness of the device, which attracted the attention of both industry and academia. It also won the best paper award in recognition of its academic quality.

 

 


The Korea Semiconductor Conference is the largest semiconductor conference in Korea with a long history and tradition, and this year's 30th edition was jointly organized by SK hynix, the Korea Semiconductor Industry Association, and the Korea Semiconductor Research Association. The award was presented at the 30th Korea Semiconductor Conference, which will be held in January 2024, and is the first prize among two papers selected from a total of 1,172 submissions.

 

 


Ha-Young Bang graduated in February 2023 from the undergraduate program at the Department of Electronic Engineering, College of Creative and Information Technology. He is currently enrolled in the third semester of his master's program and is participating as a core researcher in the ongoing industry-academia collaboration project with SAMSUNG and LG display by Prof. Daehwan Kim.

 

 

 

 

 

 

 

 

Meanwhile, the Semiconductor devices & Integrated circuits Lab @KMU (SILK: https://silk.kookmin.ac. kr/) is a four-person collaborative laboratory of Prof. Dong-Myung Kim, Prof. Dae-Hwan Kim, Sung-Jin Choi, and Jong-Ho Bae in the Department of Electronic Engineering, and is in charge of the semiconductor and sensor process and device groups under the Ministry of Science, ICT, and Future Planning's Leading Research Center Support Project "Research Center for Lifecycle ICT using Hybrid Devices (Center Director: Prof. Dae-Hwan Kim)." Currently, 34 Ph.D. students and 3 undergraduate interns are conducting collaborative research, and the lab has graduated more than 132 Ph.D. alumni who are active in the global semiconductor industry and academia.

 

 

 

 


 

 

 

 

 


This content is translated from Korean to English using the AI translation service DeepL and may contain translation errors such as jargon/pronouns.
If you find any, please send your feedback to kookminpr@kookmin.ac.kr so we can correct them.

 

View original article [click]
 

 

 

 

 

Best Paper Award at the Korean Conference on Semiconductors (KCS) / Ha-Young Bang (M.S. student, Department of Intelligent Semiconductor and Display, Graduate School of General Studies, 23)

Date 2024-03-25 Hit 399

 

 

 

 

 

 

 

 

 

 

 

Ha-Young Bang, a master's student in the Department of Intelligent Semiconductors and Displays, Graduate School of General Studies, won the best paper award at the 30th Korea Conference on Semiconductors (KCS). 

 

 


The winning paper was titled 'Investigation of dynamic negative bias temperature instability of 1x-nm DRAM peripheral PMOS transistors for cryogenic memory applications'.
As the amount of data continues to increase, there is a growing demand for high-performance and low-power computing technologies to overcome the limitations of computing large amounts of data. As a result, quantum computers need to be built as the next generation technology, but quantum computers are highly sensitive to noise and require stable operation in cryogenic environments. 
On the other hand, DRAM is one of the most stable memories in cryogenic environments, and the device gradually degrades as negative stress is applied to the pMOSFETs during CMOS inverter operation. 
 

 

 

 

 

 

 

 

This study analyzed the reliability under operating conditions at all temperatures, including cryogenic temperatures, and proposed the cause of degradation according to the gate oxide thickness of the device, which attracted the attention of both industry and academia. It also won the best paper award in recognition of its academic quality.

 

 


The Korea Semiconductor Conference is the largest semiconductor conference in Korea with a long history and tradition, and this year's 30th edition was jointly organized by SK hynix, the Korea Semiconductor Industry Association, and the Korea Semiconductor Research Association. The award was presented at the 30th Korea Semiconductor Conference, which will be held in January 2024, and is the first prize among two papers selected from a total of 1,172 submissions.

 

 


Ha-Young Bang graduated in February 2023 from the undergraduate program at the Department of Electronic Engineering, College of Creative and Information Technology. He is currently enrolled in the third semester of his master's program and is participating as a core researcher in the ongoing industry-academia collaboration project with SAMSUNG and LG display by Prof. Daehwan Kim.

 

 

 

 

 

 

 

 

Meanwhile, the Semiconductor devices & Integrated circuits Lab @KMU (SILK: https://silk.kookmin.ac. kr/) is a four-person collaborative laboratory of Prof. Dong-Myung Kim, Prof. Dae-Hwan Kim, Sung-Jin Choi, and Jong-Ho Bae in the Department of Electronic Engineering, and is in charge of the semiconductor and sensor process and device groups under the Ministry of Science, ICT, and Future Planning's Leading Research Center Support Project "Research Center for Lifecycle ICT using Hybrid Devices (Center Director: Prof. Dae-Hwan Kim)." Currently, 34 Ph.D. students and 3 undergraduate interns are conducting collaborative research, and the lab has graduated more than 132 Ph.D. alumni who are active in the global semiconductor industry and academia.

 

 

 

 


 

 

 

 

 


This content is translated from Korean to English using the AI translation service DeepL and may contain translation errors such as jargon/pronouns.
If you find any, please send your feedback to kookminpr@kookmin.ac.kr so we can correct them.

 

View original article [click]
 

 

 

 

 

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